参考文献
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
by Harland G. Tompkins, James N. Hilfiker
Momentum Press, 2016.
ISBN 978-1606507278
分光エリプソメトリー 第2版
藤原 裕之 (著)
ISBN 978-4621083222
Spectroscopic Ellipsometry: Principles and Applications
by Hiroyuki Fujiwara
John Wiley & Sons, 2007.
Springer, 2018.
ISBN 978-0470016084
Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons
by Mathias Schubert
Springer, 2005.
ISBN 978-364-2062285
Ellipsometry at the Nanoscale
by Maria Losurdo (Editor), Kurt Hingerl (Editor)
Springer, 2013.
ISBN 978-3-642-33955-4
Ellipsometry at the Nanoscale
by Karsten Hinrichs (Editor), Klaus-Jochen Eichhorn (Editor)
Springer, 2018.
ISBN 978-3313758947
Ellipsometry of Functional Organic Surfaces and Films 2nd ed. 2018 Edition
by Hiroyuki Fujiwara (Editor), Robert Collins (Editor)
Springer, 2018.
ISBN 978-3319753751
Handbook of Ellipsometry
by Harland Tompkins (Editor), Eugene A Haber (Editor)
William Andrew Publishing, 2005.
ISBN 978-0815514992
Ellipsometry and Polarized Light
by R.M.A. Azzam, N.M. Bashara
North Holland Press, 1977.
ISBN 978-0444870162